Single-particle multi-element fingerprinting (spMEF) using inductively-coupled plasma time-of-flight mass spectrometry (ICP-TOFMS) to identify engineered nanoparticles against the elevated natural background in soils

Praetorius A, Gundlach-Graham A, Goldberg E, Fabienke W, Navratilova J, Gondikas A, Kaegi R, Günther D, Hofmann T & von der Kammer F
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Praetorius, A., Gundlach-Graham, A., Goldberg, E., Fabienke, W., Navratilova, J., Gondikas, A., … von der Kammer, F. (2017). Single-particle multi-element fingerprinting (spMEF) using inductively-coupled plasma time-of-flight mass spectrometry (ICP-TOFMS) to identify engineered nanoparticles against the elevated natural background in soils. Environmental Science: Nano, 4(2), 307-314. https://doi.org/10.1039/c6en00455e