Synchrotron hard X-ray chemical imaging of trace element speciation in heterogeneous samples: development of criteria for uncertainty analysis

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Wielinski, J., Marafatto, F. F., Gogos, A., Scheidegger, A., Voegelin, A., Müller, C. R., Morgenroth, E., & Kaegi, R. (2020). Synchrotron hard X-ray chemical imaging of trace element speciation in heterogeneous samples: development of criteria for uncertainty analysis. Journal of Analytical Atomic Spectrometry, 35, 567-579. https://doi.org/10.1039/C9JA00394K