Analytical electron microscopy and focused ion beam: complementary tool for the imaging of copper sorption onto iron oxide aggregates

Choose the citation style.
Mavrocordatos, D., Steiner, M., & Boller, M. (2003). Analytical electron microscopy and focused ion beam: complementary tool for the imaging of copper sorption onto iron oxide aggregates. Journal of Microscopy, 210, 45-52. https://doi.org/10.1046/j.1365-2818.2003.01168.x