TEM-specimen preparation of cell/mineral interfaces by Focused Ion Beam milling
Obst, M., Gasser, P., Mavrocordatos, D., & Dittrich, M. (2005). TEM-specimen preparation of cell/mineral interfaces by Focused Ion Beam milling. American Mineralogist, 90(8-9), 1270-1277. https://doi.org/10.2138/am.2005.1743