Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions

Xiao Y, Wehrs J, Ma H, Al-Samman T, Korte-Kerzel S, Göken M, Michler J, Spolenak R & Wheeler JM
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Xiao, Y., Wehrs, J., Ma, H., Al-Samman, T., Korte-Kerzel, S., Göken, M., … Wheeler, J. M. (2017). Investigation of the deformation behavior of aluminum micropillars produced by focused ion beam machining using Ga and Xe ions. Scripta Materialia, 127, 191-194. https://doi.org/10.1016/j.scriptamat.2016.08.028