Ion beam profiling from the interaction with a freestanding 2D layer

Shorubalko I, Choi K, Stiefel M & Park HG
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Shorubalko, I., Choi, K., Stiefel, M., & Park, H. G. (2017). Ion beam profiling from the interaction with a freestanding 2D layer. Beilstein Journal of Nanotechnology, 8, 682-687. https://doi.org/10.3762/bjnano.8.73