Structural defects in cubic semiconductors characterized by aberration-corrected scanning transmission electron microscopy

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Arroyo Rojas Dasilva, Y., Kozak, R., Erni, R., & Rossell, M. D. (2017). Structural defects in cubic semiconductors characterized by aberration-corrected scanning transmission electron microscopy. Ultramicroscopy, 176, 11-22. https://doi.org/10.1016/j.ultramic.2016.09.015