FIBSIMS: analysis of the sample composition by secondary ion mass spectroscopy

Pillatsch L, Östlund F & Michler J
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Pillatsch, L., Östlund, F., & Michler, J. (2017). FIBSIMS: analysis of the sample composition by secondary ion mass spectroscopy. Presented at the EUFN 2017. Graz, AT.
https://www.dora.lib4ri.ch/empa/islandora/object/empa:14555
Details
Publication Type

Conference Item

Title

FIBSIMS: analysis of the sample composition by secondary ion mass spectroscopy

Author(s)

Pillatsch, Lex (206 Mechanics of Materials and Nanostructures)

Östlund, Fredrik

Michler, Johann (206 Mechanics of Materials and Nanostructures)

Editor(s)

(editor)

Publication Year

2017

Conference

EUFN 2017

Conference Place

Graz, AT

Conference Date

July 4-5, 2017

Additional Information

poster