In situ quality monitoring in am using acoustic emission: a machine learning approach

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Wasmer, K., Kenel, C., Leinenbach, C., & Shevchik, S. A. (2017). In situ quality monitoring in am using acoustic emission: a machine learning approach (pp. 386-388). Presented at the Materials science and technology (MS&T17). https://doi.org/10.7449/2017/MST_2017_386_388