Magnetic force microscopy with frequency-modulated capacitive tip–sample distance control

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Zhao, X., Schwenk, J., Mandru, A. O., Penedo, M., Baćani, M., Marioni, M. A., & Hug, H. J. (2018). Magnetic force microscopy with frequency-modulated capacitive tip–sample distance control. New Journal of Physics, 20, 013018 (11 pp.). https://doi.org/10.1088/1367-2630/aa9ca9