Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals

Meduňa M, Isa F, Jung A, Marzegalli A, Albani M, Isella G, Zweiacker K, Miglio L & von Känel H
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Meduňa, M., Isa, F., Jung, A., Marzegalli, A., Albani, M., Isella, G., … von Känel, H. (2018). Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. Journal of Applied Crystallography, 51(2), 368-385. https://doi.org/10.1107/S1600576718001450