Application of FIB-TOF-SIMS technique for elemental characterization of new thin film energy devices

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Priebe, A., Avancini, E., Sastre Pellicer, J., Bücheler, S., & Michler, J. (2018). Application of FIB-TOF-SIMS technique for elemental characterization of new thin film energy devices. Presented at the 2nd EuFN workshop 2018. Grenoble, France.