Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: effect of the aperture edge on the ion current images

Dorwling-Carter L, Aramesh M, Forró C, Tiefenauer RF, Shorubalko I, Vörös J & Zambelli T
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Dorwling-Carter, L., Aramesh, M., Forró, C., Tiefenauer, R. F., Shorubalko, I., Vörös, J., & Zambelli, T. (2018). Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: effect of the aperture edge on the ion current images. Journal of Applied Physics, 124(17), 174902 (9 pp.). https://doi.org/10.1063/1.5053879