Analysis of longitudinal twinning in y-TiAl by microcompression up to 700 °C with strain and crystal orientation mapping

Edwards TEJ, Di Gioacchino F, Mohanty G, Wehrs J, Michler J & Clegg WJ
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Edwards, T. E. J., Di Gioacchino, F., Mohanty, G., Wehrs, J., Michler, J., & Clegg, W. J. (2018). Analysis of longitudinal twinning in y-TiAl by microcompression up to 700 °C with strain and crystal orientation mapping. Presented at the Gordon research conference on thin film and small scale mechanical behavior. Lewiston, USA.