Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM

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Arroyo Rojas Dasilva, Y., Erni, R., Isa, F., Isella, G., von Känel, H., Gröning, P., & Rossell, M. D. (2019). Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM. Acta Materialia, 167, 159-166. https://doi.org/10.1016/j.actamat.2019.01.031