The on‐surface synthesis of graphene nanoribbons (GNRs) allows for the fabrication of atomically precise narrow GNRs. Despite their exceptional properties which can be tuned by ribbon width and edge structure, significant challenges remain for GNR processing and characterization. In this contribution, we use Raman spectroscopy to characterize different types of GNRs on their growth substrate and to track their quality upon substrate transfer. We present a Raman‐optimized (RO) device substrate and an optimized mapping approach that allows for the acquisition of high‐resolution Raman spectra, achieving enhancement factors as high as 120 with respect to signals measured on standard SiO₂/Si substrates. We show that this approach is well‐suited to routinely monitor the geometry‐dependent low‐frequency modes of GNRs. In particular, we track the radial breathing‐like mode (RBLM) and the shear‐like mode (SLM) for 5‐, 7‐ and 9‐atom wide armchair GNRs (AGNRs) and compare their frequencies with first‐principles calculations.