Contact engineering of single core/shell SiC/SiO2 nanowire memory unit with high current tolerance using focused femtosecond laser irradiation

Lin L, Huo J, Peng P, Zou G, Liu L, Duley WW & Zhou YN
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Lin, L., Huo, J., Peng, P., Zou, G., Liu, L., Duley, W. W., & Zhou, Y. N. (2020). Contact engineering of single core/shell SiC/SiO2 nanowire memory unit with high current tolerance using focused femtosecond laser irradiation. Nanoscale, 12(9), 5618-5626. https://doi.org/10.1039/c9nr10690a