Atomic structure and electronic properties of planar defects in SrFeO3-δ thin films

Choose the citation style.
Rossell, M. D., Agrawal, P., Campanini, M., Passerone, D., & Erni, R. (2020). Atomic structure and electronic properties of planar defects in SrFeO3-δ thin films. Physical Review Materials, 4(7), 075001 (8 pp.). https://doi.org/10.1103/PhysRevMaterials.4.075001