Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems

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Priebe, A., Xie, T., Pethö, L., & Michler, J. (2020). Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems. Journal of Analytical Atomic Spectrometry, 35(12), 2997-3006. https://doi.org/10.1039/D0JA00372G