Lattice strain and defects analysis in nanostructured semiconductor materials and devices by high-resolution X-ray diffraction: theoretical and practical aspects

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Dolabella, S., Borzì, A., Dommann, A., & Neels, A. (2021). Lattice strain and defects analysis in nanostructured semiconductor materials and devices by high-resolution X-ray diffraction: theoretical and practical aspects. Small Methods. https://doi.org/10.1002/smtd.202100932