Comparison and evaluation of newest failure rate prediction models: FIDES and RIAC 217Plus

Held M & Fritz K
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Held, M., & Fritz, K. (2009). Comparison and evaluation of newest failure rate prediction models: FIDES and RIAC 217Plus. Microelectronics and Reliability, 49(9-11), 967-971. https://doi.org/10.1016/j.microrel.2009.07.031