Correlation of high temperature x-ray photoemission valence band spectra and conductivity in strained LaSrFeNi oxide on SrTiO&lt;SUB&gt;3&lt;/SUB&gt;(110)

Braun, A.; Zhang, X.; Sun, Y.; Müller, U.; Liu, Z.; Erat, S.; Ari, M.; Grimmer, H.; Mao, S.S.; Graule, T.

doi:10.1063/1.3174916

Correlation of high temperature x-ray photoemission valence band spectra and conductivity in strained LaSrFeNi oxide on SrTiO₃(110)

Braun A, Zhang X, Sun Y, Müller U, Liu Z, Erat S, Ari M, Grimmer H, Mao SS & Graule T

Citation

Braun, A., Zhang, X., Sun, Y., Müller, U., Liu, Z., Erat, S., … Graule, T. (2009). Correlation of high temperature x-ray photoemission valence band spectra and conductivity in strained LaSrFeNi oxide on SrTiO₃(110). Applied Physics Letters, 95(2), 022107 (3 pp.). https://doi.org/10.1063/1.3174916

Persistent URL https://www.dora.lib4ri.ch/empa/islandora/object/empa:3158

Reversible and irreversible discontinuities at around 573 and 823 K in the electric conductivity of a strained 175 nm thin film of (La_0.8Sr_0.2)_0.95Ni_0.2Fe_0.8O_3−δ grown by pulsed laser deposition on SrTiO₃ (110) are reflected by valence band changes as monitored in photoemission and oxygen K-edge x-ray absorption spectra (XAS). The irreversible jump at 823 K is attributed to depletion of doped electron holes concomitant with reduction of Fe³⁺ toward Fe²⁺, as evidenced by oxygen and iron core level soft XAS, and possibly of a chemical origin, whereas the reversible jump at 573 K possibly originates from structural changes.