A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

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Liu, H., Ahmed, Z., Vranjkovic, S., Parschau, M., Mandru, A. O., & Hug, H. J. (2022). A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy. Beilstein Journal of Nanotechnology, 13, 1120-1140. https://doi.org/10.3762/BJNANO.13.95