A comparison between X-ray reflectivity and atomic force microscopy on the characterization of a surface roughness

Su H-C, Lee C-H, Lin M-Z & Huang T-W
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Su, H. C., Lee, C. H., Lin, M. Z., & Huang, T. W. (2012). A comparison between X-ray reflectivity and atomic force microscopy on the characterization of a surface roughness. Chinese Journal of Physics, 50(2), 291-300.