A comparison between X-ray reflectivity and atomic force microscopy on the characterization of a surface roughness
Su H-C, Lee C-H, Lin M-Z & Huang T-W
Su, H. C., Lee, C. H., Lin, M. Z., & Huang, T. W. (2012). A comparison between X-ray reflectivity and atomic force microscopy on the characterization of a surface roughness. Chinese Journal of Physics, 50(2), 291-300.