In-situ TOF-SIMS and SFM measurements providing true 3D chemical characterization of inorganic and organic nanostructures

Niehuis E, Moellers R, Kollmer F, Arlinghaus H, Bernard L, Hug HJ, Vranjkovic S, Dianoux R & Scheidemann A
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Niehuis, E., Moellers, R., Kollmer, F., Arlinghaus, H., Bernard, L., Hug, H. J., … Scheidemann, A. (2014). In-situ TOF-SIMS and SFM measurements providing true 3D chemical characterization of inorganic and organic nanostructures. Microscopy and Microanalysis, 20(Suppl. 3), 2086-2087. https://doi.org/10.1017/S1431927614012161
https://www.dora.lib4ri.ch/empa/islandora/object/empa:6545
Details
Publication Type

Journal Article

Title

In-situ TOF-SIMS and SFM measurements providing true 3D chemical characterization of inorganic and organic nanostructures

Author(s)

Niehuis, Ewald

Moellers, Rudolf

Kollmer, Felix

Arlinghaus, Henrik

Bernard, Laetita (203 Nanoscale Materials Science)

Hug, Hans Josef (203 Nanoscale Materials Science)

Vranjkovic, Sasa (203 Nanoscale Materials Science)

Dianoux, Raphaelle

Scheidemann, Adi

Journal

Microscopy and Microanalysis

Volume

20

Issue

Suppl. 3

Start Page

2086

End Page

2087

Publication Year

2014

Additional Information

#green This article is made freely available with permission of the rights holder based on a Swiss National License.