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  • (-) Organizational Unit = 405 Transport at Nanoscale Interfaces
  • (-) Publication Year = 2006 - 2006
  • (-) Empa Authors = Hofmann, Jürgen
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A wall-thickness-based method of adaptive integration time determination for X-ray computed tomography
Hofmann, J., & Flisch, A. (2006). A wall-thickness-based method of adaptive integration time determination for X-ray computed tomography. NDT and E International, 39(8), 668-674. https://doi.org/10.1016/j.ndteint.2006.06.001
Statistical beam-hardening correction for industrial X-ray computed tomography
Thierry, R., Flisch, A., Miceli, A., & Hofmann, J. (2006). Statistical beam-hardening correction for industrial X-ray computed tomography (p. We.3.7.2 (10 pp.). Presented at the 9th European conference on non-destructive testing (ECNDT 2006). Berlin, Germany.