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  • (-) Organizational Unit = 405 Transport at Nanoscale Interfaces
  • (-) Publication Year = 2006 - 2006
  • (-) Empa Authors = Nellen, Philipp M.
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Reliability, standardization, and validation of optical fiber sensors
Brönnimann, R., Held, M., & Nellen, P. M. (2006). Reliability, standardization, and validation of optical fiber sensors (p. 4 pp.). Presented at the 18th International Conference on Optical Fiber Sensors. Cancún, México.
Fabrication and electrical characterization of circuits based on individual tin oxide nanowires
Hernández-Ramírez, F., Tarancón, A., Casals, O., Rodríguez, J., Romano-Rodríguez, A., Morante, J. R., … Nellen, P. M. (2006). Fabrication and electrical characterization of circuits based on individual tin oxide nanowires. Nanotechnology, 17(22), 5577-5583. https://doi.org/10.1088/0957-4484/17/22/009
FIB-milling of photonic structures and sputtering simulation
Nellen, P. M., Callegari, V., & Brönnimann, R. (2006). FIB-milling of photonic structures and sputtering simulation. Microelectronic Engineering, 83(4-9), 1805-1808. https://doi.org/10.1016/j.mee.2006.01.176
Focused ion beam modifications on indium phosphide photonic crystals
Nellen, P. M., Callegari, V., Strasser, P., Rauscher, K., Wüest, R., Erni, D., & Robin, F. (2006). Focused ion beam modifications on indium phosphide photonic crystals (p. 2 pp.). Presented at the 32nd International Conference on Micro- and Nano-Engineering 2006. Barcelona, Spain.
Milling micro-structures using focused ion beams and its application to photonic components
Nellen, P. M., & Brönnimann, R. (2006). Milling micro-structures using focused ion beams and its application to photonic components. Measurement Science and Technology, 17(5), 943-948. https://doi.org/10.1088/0957-0233/17/5/S01
Preparative methods for nanoanalysis of materials with focused ion beam instruments
Nellen, P. M., Callegari, V., & Sennhauser, U. (2006). Preparative methods for nanoanalysis of materials with focused ion beam instruments. Chimia, 60(11), 735-741. https://doi.org/10.2533/chimia.2006.735