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Empa Laboratories = 405 Transport at Nanoscale Interfaces
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Publication Year = 2017
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Journal ≠ Analytical Chemistry
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Keywords = focused ion beam
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Ion beam profiling from the interaction with a freestanding 2D layer
Shorubalko, I., Choi, K., Stiefel, M., & Park, H. G. (2017). Ion beam profiling from the interaction with a freestanding 2D layer.
Beilstein Journal of Nanotechnology
,
8
, 682-687. https://doi.org/10.3762/bjnano.8.73
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