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A single probe for imaging photons, electrons and physical forces
Pilet, N., Lisunova, Y., Lamattina, F., Stevenson, S. E., Pigozzi, G., Paruch, P., … Raabe, J. (2016). A single probe for imaging photons, electrons and physical forces. Nanotechnology, 27, 235705 (9 pp.). https://doi.org/10.1088/0957-4484/27/23/235705
Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system
Pilet, N., Raabe, J., Stevenson, S. E., Romer, S., Bernard, L., McNeill, C. R., … Quitmann, C. (2012). Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system. Nanotechnology, 23(47), 475708 (8 pp.). https://doi.org/10.1088/0957-4484/23/47/475708