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Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system
Pilet, N., Raabe, J., Stevenson, S. E., Romer, S., Bernard, L., McNeill, C. R., … Quitmann, C. (2012). Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system. Nanotechnology, 23(47), 475708 (8 pp.). https://doi.org/10.1088/0957-4484/23/47/475708