Active Filters

  • (-) … = empa-units:8
  • (-) Journal = Physical Review Materials
Search Results 1 - 3 of 3
  • RSS Feed
Select Page
Atomic structure and electronic properties of planar defects in SrFeO<sub>3-<em>δ</em></sub> thin films
Rossell, M. D., Agrawal, P., Campanini, M., Passerone, D., & Erni, R. (2020). Atomic structure and electronic properties of planar defects in SrFeO3-δ thin films. Physical Review Materials, 4(7), 075001 (8 pp.). https://doi.org/10.1103/PhysRevMaterials.4.075001
Structure and properties of edge dislocations in BiFeO<sub>3</sub>
Agrawal, P., Campanini, M., Rappe, A., Liu, S., Grillo, V., Hébert, C., … Rossell, M. D. (2019). Structure and properties of edge dislocations in BiFeO3. Physical Review Materials, 3(3), 034410 (11 pp.). https://doi.org/10.1103/PhysRevMaterials.3.034410
Stair-rod dislocation cores acting as one-dimensional charge channels in GaAs nanowires
Bologna, N., Agrawal, P., Campanini, M., Knödler, M., Rossell, M. D., Erni, R., & Passerone, D. (2018). Stair-rod dislocation cores acting as one-dimensional charge channels in GaAs nanowires. Physical Review Materials, 2(1), 014603 (6 pp.). https://doi.org/10.1103/PhysRevMaterials.2.014603