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Fast power cycling test for insulated gate bipolar transistor modules in traction application
Held, M., Jacob, P., Nicoletti, G., Scacco, P., & Poech, M. H. (1999). Fast power cycling test for insulated gate bipolar transistor modules in traction application. International Journal of Electronics, 86(10), 1193-1204. https://doi.org/10.1080/002072199132743