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High sensitivity of fluorine gas-assisted FIB-TOF-SIMS for chemical characterization of buried sublayers in thin films
Priebe, A., Pethö, L., Huszar, E., Xie, T., Utke, I., & Michler, J. (2021). High sensitivity of fluorine gas-assisted FIB-TOF-SIMS for chemical characterization of buried sublayers in thin films. ACS Applied Materials and Interfaces. https://doi.org/10.1021/acsami.1c01627
Practical aspects of focused ion beam time-of-flight secondary ion mass spectrometry analysis enhanced by fluorine gas coinjection
Wieczerzak, K., Priebe, A., Utke, I., & Michler, J. (2021). Practical aspects of focused ion beam time-of-flight secondary ion mass spectrometry analysis enhanced by fluorine gas coinjection. Chemistry of Materials. https://doi.org/10.1021/acs.chemmater.1c00052
Elemental characterization of Al nanoparticles buried under a Cu thin film - TOF-SIMS vs. STEM/EDX
Priebe, A., Barnes, J. P., Edwards, T. E. J., Huszár, E., Pethö, L., & Michler, J. (2020). Elemental characterization of Al nanoparticles buried under a Cu thin film - TOF-SIMS vs. STEM/EDX. Analytical Chemistry, 92(18), 12518-12527. https://doi.org/10.1021/acs.analchem.0c02361
Fluorine gas coinjection as a solution for enhancing spatial resolution of time-of-flight secondary ion mass spectrometry and separating mass interference
Priebe, A., Pethö, L., & Michler, J. (2020). Fluorine gas coinjection as a solution for enhancing spatial resolution of time-of-flight secondary ion mass spectrometry and separating mass interference. Analytical Chemistry, 92(2), 2121-2129. https://doi.org/10.1021/acs.analchem.9b04647
Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems
Priebe, A., Xie, T., Pethö, L., & Michler, J. (2020). Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems. Journal of Analytical Atomic Spectrometry, 35(12), 2997-3006. https://doi.org/10.1039/D0JA00372G
The matrix effect in TOF-SIMS analysis of two-element inorganic thin films
Priebe, A., Xie, T., Bürki, G., Pethö, L., & Johann, M. (2020). The matrix effect in TOF-SIMS analysis of two-element inorganic thin films. Journal of Analytical Atomic Spectrometry, 35(6), 1156 (11 pp.). https://doi.org/10.1039/C9JA00428A
Lithium garnet Li<sub>7</sub>La<sub>3</sub>Zr<sub>2</sub>O<sub>12</sub> electrolyte for all-solid-state batteries: closing the gap between bulk and thin film Li-ion conductivities
Sastre, J., Priebe, A., Döbeli, M., Michler, J., Tiwari, A. N., & Romanyuk, Y. E. (2020). Lithium garnet Li7La3Zr2O12 electrolyte for all-solid-state batteries: closing the gap between bulk and thin film Li-ion conductivities. Advanced Materials Interfaces, 7, 2000425 (11 pp.). https://doi.org/10.1002/admi.202000425
3D imaging of nanoparticles in an inorganic matrix using TOF-SIMS validated with STEM and EDX
Priebe, A., Barnes, J. P., Edwards, T. E. J., Pethö, L., Balogh, I., & Michler, J. (2019). 3D imaging of nanoparticles in an inorganic matrix using TOF-SIMS validated with STEM and EDX. Analytical Chemistry, 91(18), 11834-11839. https://doi.org/10.1021/acs.analchem.9b02545
Application of a gas-injection system during the FIB-TOF-SIMS analysis — Influence of water vapor and fluorine gas on secondary ion signals and sputtering rates
Priebe, A., Utke, I., Pethö, L., & Michler, J. (2019). Application of a gas-injection system during the FIB-TOF-SIMS analysis — Influence of water vapor and fluorine gas on secondary ion signals and sputtering rates. Analytical Chemistry, 91(18), 11712-11722. https://doi.org/10.1021/acs.analchem.9b02287
Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuum
Priebe, A., & Michler, J. (2019). Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuum. Ultramicroscopy, 196, 10-17. https://doi.org/10.1016/j.ultramic.2018.09.008
Simultaneous gas co-injection during a FIB-TOF-SIMS measurement as a solution for enhancing spatial resolution and de-coupling mass interference
Priebe, A., Utke, I., Pethö, L., & Michler, J. (2019). Simultaneous gas co-injection during a FIB-TOF-SIMS measurement as a solution for enhancing spatial resolution and de-coupling mass interference. Presented at the 22nd International conference on secondary ion mass spectrometry – SIMS-22. Kyoto, Japan.
Aluminum-assisted densification of cosputtered lithium garnet electrolyte films for solid-state batteries
Sastre, J., Lin, T. Y., Filippin, A. N., Priebe, A., Avancini, E., Michler, J., … Buecheler, S. (2019). Aluminum-assisted densification of cosputtered lithium garnet electrolyte films for solid-state batteries. ACS Applied Energy Materials, 2(12), 8511-8524. https://doi.org/10.1021/acsaem.9b01387
Voids and compositional inhomogeneities in Cu(In,Ga)Se<sub>2</sub> thin films: evolution during growth and impact on solar cell performance
Avancini, E., Keller, D., Carron, R., Arroyo-Rojas Dasilva, Y., Erni, R., Priebe, A., … Tiwari, A. N. (2018). Voids and compositional inhomogeneities in Cu(In,Ga)Se2 thin films: evolution during growth and impact on solar cell performance. Science and Technology of Advanced Materials, 19(1), 871-882. https://doi.org/10.1080/14686996.2018.1536679
Application of FIB-TOF-SIMS technique for elemental characterization of new thin film energy devices
Priebe, A., Avancini, E., Sastre Pellicer, J., Bücheler, S., & Michler, J. (2018). Application of FIB-TOF-SIMS technique for elemental characterization of new thin film energy devices. Presented at the 2nd EuFN workshop 2018. Grenoble, France.
Correlative FIB-TOFSIMS, AFM and SEM technique for analysing 3D elemental and topological structure of materials
Pillatsch, L., Östlund, F., Priebe, A., & Michler, J. (2017). Correlative FIB-TOFSIMS, AFM and SEM technique for analysing 3D elemental and topological structure of materials. Presented at the Microscopy Conference 2017. Lausanne, Switzerland.
FIBSIMS: secondary ion mass spectrometry capability integrated on an FIBSEM instrument
Pillatsch, L., Priebe, A., Östlund, F., & Michler, J. (2017). FIBSIMS: secondary ion mass spectrometry capability integrated on an FIBSEM instrument. Presented at the 17th European conference on applications of surface and interface analysis ECASIA 2017. Montpellier, France.