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  • (-) Empa Authors = Priebe, Agnieszka
  • (-) Keywords = chemical structure
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High sensitivity of fluorine gas-assisted FIB-TOF-SIMS for chemical characterization of buried sublayers in thin films
Priebe, A., Pethö, L., Huszar, E., Xie, T., Utke, I., & Michler, J. (2021). High sensitivity of fluorine gas-assisted FIB-TOF-SIMS for chemical characterization of buried sublayers in thin films. ACS Applied Materials and Interfaces, 13(13), 15890-15900. https://doi.org/10.1021/acsami.1c01627
Elemental characterization of Al nanoparticles buried under a Cu thin film - TOF-SIMS vs. STEM/EDX
Priebe, A., Barnes, J. P., Edwards, T. E. J., Huszár, E., Pethö, L., & Michler, J. (2020). Elemental characterization of Al nanoparticles buried under a Cu thin film - TOF-SIMS vs. STEM/EDX. Analytical Chemistry, 92(18), 12518-12527. https://doi.org/10.1021/acs.analchem.0c02361