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Elemental characterization of Al nanoparticles buried under a Cu thin film - TOF-SIMS vs. STEM/EDX
Priebe, A., Barnes, J. P., Edwards, T. E. J., Huszár, E., Pethö, L., & Michler, J. (2020). Elemental characterization of Al nanoparticles buried under a Cu thin film - TOF-SIMS vs. STEM/EDX. Analytical Chemistry, 92(18), 12518-12527. https://doi.org/10.1021/acs.analchem.0c02361
Synthesis of model Al-Al<sub>2</sub>O<sub>3</sub> multilayer systems with monolayer oxide thickness control by circumventing native oxidation
Xie, T., Edwards, T. E. J., della Ventura, N. M., Casari, D., Huszár, E., Fu, L., … Pethö, L. (2020). Synthesis of model Al-Al2O3 multilayer systems with monolayer oxide thickness control by circumventing native oxidation. Thin Solid Films, 711, 138287 (8 pp.). https://doi.org/10.1016/j.tsf.2020.138287
In situ fragmentation analysis of ALD-PVD multilayers on flexible substrates
Putz, B., Edwards, T., Huszar, E., Pethö, L., Kreiml, P., Cordill, M., … Michler, J. (2019). In situ fragmentation analysis of ALD-PVD multilayers on flexible substrates. Presented at the ECI Nanomechanical testing in materials research and development VII. Malaga, Spain.