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Strain depth profiles in thin films extracted from in-plane X-ray diffraction
Cancellieri, C., Ariosa, D., Druzhinin, A. V., Unutulmazsoy, Y., Neels, A., & Jeurgens, L. P. H. (2021). Strain depth profiles in thin films extracted from in-plane X-ray diffraction. Journal of Applied Crystallography, 54, 87-98. https://doi.org/10.1107/S1600576720014843
The effect of the graded bilayer design on the strain depth profiles and microstructure of Cu/W nano-multilayers
Druzhinin, A. V., Lorenzin, G., Ariosa, D., Siol, S., Straumal, B. B., Janczak-Rusch, J., … Cancellieri, C. (2021). The effect of the graded bilayer design on the strain depth profiles and microstructure of Cu/W nano-multilayers. Materials and Design, 209, 110002 (11 pp.). https://doi.org/10.1016/j.matdes.2021.110002
Effect of internal stress on short-circuit diffusion in thin films and nanolaminates: application to Cu/W nano-multilayers
Druzhinin, A. V., Rheingans, B., Siol, S., Straumal, B. B., Janczak-Rusch, J., Jeurgens, L. P. H., & Cancellieri, C. (2020). Effect of internal stress on short-circuit diffusion in thin films and nanolaminates: application to Cu/W nano-multilayers. Applied Surface Science, 508, 145254 (9 pp.). https://doi.org/10.1016/j.apsusc.2020.145254
Effect of the individual layer thickness on the transformation of Cu/W nano-multilayers into nanocomposites
Druzhinin, A. V., Ariosa, D., Siol, S., Ott, N., Straumal, B. B., Janczak-Rusch, J., … Cancellieri, C. (2019). Effect of the individual layer thickness on the transformation of Cu/W nano-multilayers into nanocomposites. Materialia, 7, 100400 (11 pp.). https://doi.org/10.1016/j.mtla.2019.100400