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Enhancing the insulating and dielectric properties of barrier anodic Al<sub>2</sub>O<sub>3</sub> on high purity aluminum
González-Castaño, M., Cancellieri, C., Maeder, X., Hack, E., & Schmutz, P. (2020). Enhancing the insulating and dielectric properties of barrier anodic Al2O3 on high purity aluminum. Applied Surface Science, 505, 144522 (12 pp.). https://doi.org/10.1016/j.apsusc.2019.144522
Electronic and structural characterization of barrier-type amorphous aluminium oxide
Evangelisti, F., Stiefel, M., Guseva, O., Nia, R. P., Hauert, R., Hack, E., … Cancellieri, C. (2017). Electronic and structural characterization of barrier-type amorphous aluminium oxide. Electrochimica Acta, 224, 503-516. https://doi.org/10.1016/j.electacta.2016.12.090