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Modeling of interface and internal disorder applied to XRD analysis of Ag-based nano-multilayers
Ariosa, D., Cancellieri, C., Araullo-Peters, V., Chiodi, M., Klyatskina, E., Janczak-Rusch, J., & Jeurgens, L. P. H. (2018). Modeling of interface and internal disorder applied to XRD analysis of Ag-based nano-multilayers. ACS Applied Materials and Interfaces, 10(24), 20938-20949. https://doi.org/10.1021/acsami.8b02653
The effect of interfacial Ge and RF-Bias on the microstructure and stress evolution upon annealing of Ag/AlN multilayers
Cancellieri, C., Klyatskina, E., Chiodi, M., Janczak-Rusch, J., & Jeurgens, L. (2018). The effect of interfacial Ge and RF-Bias on the microstructure and stress evolution upon annealing of Ag/AlN multilayers. Applied Sciences, 8(12), 2403 (13 pp.). https://doi.org/10.3390/app8122403