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Application of FIB-TOF-SIMS technique for elemental characterization of new thin film energy devices
Priebe, A., Avancini, E., Sastre Pellicer, J., Bücheler, S., & Michler, J. (2018). Application of FIB-TOF-SIMS technique for elemental characterization of new thin film energy devices. Presented at the 2nd EuFN workshop 2018. Grenoble, France.
Analysis of spontaneous dehydrogenation reactions
Callini, E., Stadie, N., Borgschulte, A., & Züttel, A. (2013). Analysis of spontaneous dehydrogenation reactions. Presented at the Materials research society fall meeting 2013. Boston, USA.