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Application of FIB-TOF-SIMS technique for elemental characterization of new thin film energy devices
Priebe, A., Avancini, E., Sastre Pellicer, J., Bücheler, S., & Michler, J. (2018).
Application of FIB-TOF-SIMS technique for elemental characterization of new thin film energy devices
. Presented at the 2nd EuFN workshop 2018. Grenoble, France.
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Analysis of spontaneous dehydrogenation reactions
Callini, E., Stadie, N., Borgschulte, A., & Züttel, A. (2013).
Analysis of spontaneous dehydrogenation reactions
. Presented at the Materials research society fall meeting 2013. Boston, USA.
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