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  • (-) Empa Laboratories = 299 Electron Microscopy Center
  • (-) Publication Year = 2010 - 2019
  • (-) Empa Authors ≠ Erni, Rolf
  • (-) Keywords ≠ A. shaping
  • (-) Journal = Applied Physics Letters
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Nanoscale analysis of electrical junctions in InGaP nanowires grown by template-assisted selective epitaxy
Piazza, V., Wirths, S., Bologna, N., Ahmed, A. A., Bayle, F., Schmid, H., … Tchernycheva, M. (2019). Nanoscale analysis of electrical junctions in InGaP nanowires grown by template-assisted selective epitaxy. Applied Physics Letters, 114(10), 103101 (4 pp.). https://doi.org/10.1063/1.5085405
Ballistic one-dimensional transport in InAs nanowires monolithically integrated on silicon
Gooth, J., Schaller, V., Wirths, S., Schmid, H., Borg, M., Bologna, N., … Riel, H. (2017). Ballistic one-dimensional transport in InAs nanowires monolithically integrated on silicon. Applied Physics Letters, 110(8), 083105 (5 pp.). https://doi.org/10.1063/1.4977031
Phase retrieval of an electron vortex beam using diffraction holography
Venturi, F., Campanini, M., Gazzadi, G. C., Balboni, R., Frabboni, S., Boyd, R. W., … Grillo, V. (2017). Phase retrieval of an electron vortex beam using diffraction holography. Applied Physics Letters, 111(22), 223101 (5 pp.). https://doi.org/10.1063/1.4998595
Phase constitution and interface structure of nano-sized Ag-Cu/AlN multilayers: experiment and <I>ab initio</I> modeling
Pigozzi, G., Antušek, A., Janczak-Rusch, J., Parlinska-Wojtan, M., Passerone, D., Pignedoli, C. A., … Jeurgens, L. P. H. (2012). Phase constitution and interface structure of nano-sized Ag-Cu/AlN multilayers: experiment and ab initio modeling. Applied Physics Letters, 101(18), 181602 (5 pp.). https://doi.org/10.1063/1.4761471
Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties
Raghavan, R., Bechelany, M., Parlinska, M., Frey, D., Mook, W. M., Beyer, A., … Utke, I. (2012). Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties. Applied Physics Letters, 100(19), 191912 (4 pp.). https://doi.org/10.1063/1.4711767