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  • (-) Organizational Unit = 299 Electron Microscopy Center
  • (-) Publication Year = 2010 - 2019
  • (-) Empa Authors ≠ Graule, Thomas J.
  • (-) Empa Authors = Isa, Fabio
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Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM
Arroyo Rojas Dasilva, Y., Erni, R., Isa, F., Isella, G., von Känel, H., Gröning, P., & Rossell, M. D. (2019). Atomic-scale structural characterization of grain boundaries in epitaxial Ge/Si microcrystals by HAADF-STEM. Acta Materialia, 167, 159-166. https://doi.org/10.1016/j.actamat.2019.01.031
Effect of thermal annealing on the interface quality of Ge/Si heterostructures
Arroyo Rojas Dasilva,, Isa, F., Isella, G., Erni, R., von Känel, H., Gröning, P., & Rossell, M. D. (2019). Effect of thermal annealing on the interface quality of Ge/Si heterostructures. Scripta Materialia, 170, 52-56. https://doi.org/10.1016/j.scriptamat.2019.05.025
Electrical properties of Si-Si interfaces obtained by room temperature covalent wafer bonding
Jung, A., Zhang, Y., Arroyo Rojas Dasilva, Y., Isa, F., & von Känel, H. (2018). Electrical properties of Si-Si interfaces obtained by room temperature covalent wafer bonding. Journal of Applied Physics, 123(8), 085701 (5 pp.). https://doi.org/10.1063/1.5020139
Growth temperature dependent strain in relaxed Ge microcrystals
Meduňa, M., Falub, C. V., Isa, F., & von Känel, H. (2018). Growth temperature dependent strain in relaxed Ge microcrystals. Thin Solid Films, 664, 115-123. https://doi.org/10.1016/j.tsf.2018.08.033
Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals
Meduňa, M., Isa, F., Jung, A., Marzegalli, A., Albani, M., Isella, G., … von Känel, H. (2018). Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. Journal of Applied Crystallography, 51(2), 368-385. https://doi.org/10.1107/S1600576718001450
Dislocation-free SiGe/Si heterostructures
Montalenti, F., Rovaris, F., Bergamaschini, R., Miglio, L., Salvalaglio, M., Isella, G., … von Känel, H. (2018). Dislocation-free SiGe/Si heterostructures. Crystals, 8(6), 257 (16 pp.). https://doi.org/10.3390/cryst8060257
Strain relaxation in epitaxial Ge crystals grown on patterned Si(001) substrates
Arroyo Rojas Dasilva, Y., Rossell, M. D., Isa, F., Erni, R., Isella, G., von Känel, H., & Gröning, P. (2017). Strain relaxation in epitaxial Ge crystals grown on patterned Si(001) substrates. Scripta Materialia, 127, 169-172. https://doi.org/10.1016/j.scriptamat.2016.09.003
Strain engineering in highly mismatched SiGe/Si heterostructures
Isa, F., Jung, A., Salvalaglio, M., Arroyo Rojas Dasilva, Y., Marozau, I., Meduňa, M., … von Känel, H. (2017). Strain engineering in highly mismatched SiGe/Si heterostructures. Materials Science in Semiconductor Processing, 70, 117-122. https://doi.org/10.1016/j.mssp.2016.08.019
Three-dimensional SiGe/Si heterostructures: switching the dislocation sign by substrate under-etching
Rovaris, F., Isa, F., Gatti, R., Jung, A., Isella, G., Montalenti, F., & von Känel, H. (2017). Three-dimensional SiGe/Si heterostructures: switching the dislocation sign by substrate under-etching. Physical Review Materials, 1(7), 073602 (8 pp.). https://doi.org/10.1103/PhysRevMaterials.1.073602
Elastic and plastic stress relaxation in highly mismatched SiGe/Si crystals
Isa, F., Jung, A., Salvalaglio, M., Arroyo Rojas Dasilva, Y., Meduňa, M., Barget, M., … von Känel, H. (2016). Elastic and plastic stress relaxation in highly mismatched SiGe/Si crystals. MRS Advances, 1(50), 3403-3408. https://doi.org/10.1557/adv.2016.355
Enhancing elastic stress relaxation in SiGe/Si heterostructures by Si pillar necking
Isa, F., Salvalaglio, M., Arroyo Rojas Dasilva, Y., Jung, A., Isella, G., Erni, R., … von Känel, H. (2016). Enhancing elastic stress relaxation in SiGe/Si heterostructures by Si pillar necking. Applied Physics Letters, 109(18), 182112 (5 pp.). https://doi.org/10.1063/1.4966948
From plastic to elastic stress relaxation in highly mismatched SiGe/Si heterostructures
Isa, F., Salvalaglio, M., Arroyo Rojas Dasilva, Y., Jung, A., Isella, G., Erni, R., … von Känel, H. (2016). From plastic to elastic stress relaxation in highly mismatched SiGe/Si heterostructures. Acta Materialia, 114, 97-105. https://doi.org/10.1016/j.actamat.2016.05.014
Highly mismatched, dislocation-free SiGe/Si heterostructures
Isa, F., Salvalaglio, M., Arroyo Rojas Dasilva, Y., Meduňa, M., Barget, M., Jung, A., … von Känel, H. (2016). Highly mismatched, dislocation-free SiGe/Si heterostructures. Advanced Materials, 28(5), 884-888. https://doi.org/10.1002/adma.201504029