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  • (-) Empa Laboratories = 299 Electron Microscopy Center
  • (-) Publication Year = 2010 - 2019
  • (-) Keywords ≠ GaAs
  • (-) Empa Authors ≠ Kovalenko, Maksym V.
  • (-) Journal = Advanced Materials
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Domain wall architecture in tetragonal ferroelectric thin films
De Luca, G., Rossell, M. D., Schaab, J., Viart, N., Fiebig, M., & Trassin, M. (2017). Domain wall architecture in tetragonal ferroelectric thin films. Advanced Materials, 29(7), 1605145 (5 pp.). https://doi.org/10.1002/adma.201605145
Highly mismatched, dislocation-free SiGe/Si heterostructures
Isa, F., Salvalaglio, M., Arroyo Rojas Dasilva, Y., Meduňa, M., Barget, M., Jung, A., … von Känel, H. (2016). Highly mismatched, dislocation-free SiGe/Si heterostructures. Advanced Materials, 28(5), 884-888. https://doi.org/10.1002/adma.201504029
Determination of the local chemical structure of graphene oxide and reduced graphene oxide
Erickson, K., Erni, R., Lee, Z., Alem, N., Gannett, W., & Zettl, A. (2010). Determination of the local chemical structure of graphene oxide and reduced graphene oxide. Advanced Materials, 22(40), 4467-4472. https://doi.org/10.1002/adma.201000732