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  • (-) Organizational Unit = 299 Electron Microscopy Center
  • (-) Publication Year = 2010 - 2019
  • (-) Keywords ≠ electron microscopy
  • (-) Organizational Unit = 405 Transport at Nanoscale Interfaces
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Direct-epitaxial growth of SrAl<sub>2</sub>O<sub>4</sub>: Eu,Dy thin films on Al<sub>2</sub>O<sub>3</sub> substrate by pulsed laser deposition
Ma, H., Gagnidze, T., Walfort, B., Rossell, M. D., Cancellieri, C., Shorubalko, I., & La Mattina, F. (2019). Direct-epitaxial growth of SrAl2O4: Eu,Dy thin films on Al2O3 substrate by pulsed laser deposition. Applied Surface Science, 491, 53-59. https://doi.org/10.1016/j.apsusc.2019.06.098
Epitaxial thin films as a model system for Li-Ion conductivity in Li<sub>4</sub>Ti<sub>5</sub>O<sub>12</sub>
Pagani, F., Stilp, E., Pfenninger, R., Reyes, E. C., Remhof, A., Balogh-Michels, Z., … Battaglia, C. (2018). Epitaxial thin films as a model system for Li-Ion conductivity in Li4Ti5O12. ACS Applied Materials and Interfaces, 10(51), 44494-44500. https://doi.org/10.1021/acsami.8b16519
Cyanine tandem and triple-junction solar cells
Zhang, H., Niesen, B., Hack, E., Jenatsch, S., Wang, L., Véron, A. C., … Nüesch, F. (2016). Cyanine tandem and triple-junction solar cells. Organic Electronics, 30(11), 191-199. https://doi.org/10.1016/j.orgel.2015.12.013
Enhanced carrier collection from CdS passivated grains in solution-processed Cu<SUB>2</SUB>ZnSn(S,Se)<SUB>4</SUB> solar cells
Werner, M., Keller, D., Haass, S. G., Gretener, C., Bissig, B., Fuchs, P., … Tiwari, A. N. (2015). Enhanced carrier collection from CdS passivated grains in solution-processed Cu2ZnSn(S,Se)4 solar cells. ACS Applied Materials and Interfaces, 7(22), 12141-12146. https://doi.org/10.1021/acsami.5b02435
Characterization of multi-scale microstructural features in Opalinus Clay
Keller, L. M., Schuetz, P., Erni, R., Rossell, M. D., Lucas, F., Gasser, P., & Holzer, L. (2013). Characterization of multi-scale microstructural features in Opalinus Clay. Microporous and Mesoporous Materials, 170, 83-94. https://doi.org/10.1016/j.micromeso.2012.11.029
Transmission electron microscopy characterization of TiN/SiN<SUB>x</SUB> multilayered coatings plastically deformed by nanoindentation
Parlinska-Wojtan, M., Meier, S., & Patscheider, J. (2010). Transmission electron microscopy characterization of TiN/SiNx multilayered coatings plastically deformed by nanoindentation. Thin Solid Films, 518(17), 4890-4897. https://doi.org/10.1016/j.tsf.2010.02.064