Active Filters

  • (-) Organizational Unit = 299 Electron Microscopy Center
  • (-) Publication Year = 2010 - 2019
  • (-) Organizational Unit = 100 Directorate
  • (-) Empa Authors = Kozak, Roksolana
Search Results 1 - 1 of 1
  • CSV Spreadsheet
  • Excel Spreadsheet
  • RSS Feed
Select Page
A comparative study of defect formation in GaAs nanocrystals selectively grown on nanopatterned and flat Si(001) substrates
Kozak, R., Prieto, I., Arroyo Rojas Dasilva, Y., Erni, R., von Känel, H., Bona, G. L., & Rossell, M. D. (2018). A comparative study of defect formation in GaAs nanocrystals selectively grown on nanopatterned and flat Si(001) substrates. Micron, 113, 83-90. https://doi.org/10.1016/j.micron.2018.06.018