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  • (-) Organizational Unit = 299 Electron Microscopy Center
  • (-) Publication Year = 2010 - 2019
  • (-) Journal = Physical Review Letters
  • (-) Empa Authors = Rossell, Marta D.
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Depolarizing-field effects in epitaxial capacitor heterostructures
Strkalj, N., De Luca, G., Campanini, M., Pal, S., Schaab, J., Gattinoni, C., … Trassin, M. (2019). Depolarizing-field effects in epitaxial capacitor heterostructures. Physical Review Letters, 123(14), 147601 (7 pp.). https://doi.org/10.1103/PhysRevLett.123.147601
Evidence of sharp and diffuse domain walls in BiFeO<SUB>3</SUB> by means of unit-cell-wise strain and polarization maps obtained with high resolution scanning transmission electron microscopy
Lubk, A., Rossell, M. D., Seidel, J., He, Q., Yang, S. Y., Chu, Y. H., … Snoeck, E. (2012). Evidence of sharp and diffuse domain walls in BiFeO3 by means of unit-cell-wise strain and polarization maps obtained with high resolution scanning transmission electron microscopy. Physical Review Letters, 109(4), 047601 (5 pp.). https://doi.org/10.1103/PhysRevLett.109.047601
Atomic structure of highly strained BiFeO<SUB>3 </SUB>thin films
Rossell, M. D., Erni, R., Prange, M. P., Idrobo, J. C., Luo, W., Zeches, R. J., … Ramesh, R. (2012). Atomic structure of highly strained BiFeO3 thin films. Physical Review Letters, 108(4), 047601 (5 pp.). https://doi.org/10.1103/PhysRevLett.108.047601