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Different ways to improve the cleanliness of the sputter source in GD-OES systems
Aeberhard, M., Nelis, T., Michler, J., & Barisone, E. (2008). Different ways to improve the cleanliness of the sputter source in GD-OES systems. Presented at the GD-OES deutsches Anwendertreffen. Berlin, Germany.
Depth profile analysis using glow discharge time of flight mass spectrometry
Canulescu, S., Whitby, J. A., Aeberhard, M., Hohl, M., Fuhrer, K., Gonin, M., & Michler, J. (2008). Depth profile analysis using glow discharge time of flight mass spectrometry. Presented at the German GD user group meeting. Dresden, Germany.