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Different ways to improve the cleanliness of the sputter source in GD-OES systems
Aeberhard, M., Nelis, T., Michler, J., & Barisone, E. (2008). Different ways to improve the cleanliness of the sputter source in GD-OES systems. Presented at the GD-OES deutsches Anwendertreffen. Berlin, Germany.
Depth profile analysis using glow discharge time of flight mass spectrometry
Canulescu, S., Whitby, J. A., Aeberhard, M., Hohl, M., Fuhrer, K., Gonin, M., & Michler, J. (2008). Depth profile analysis using glow discharge time of flight mass spectrometry. Presented at the German GD user group meeting. Dresden, Germany.
A simple method for measuring plasma power in rf-GDOES instruments
Nelis, T., Aeberhard, M., Rohr, L., Michler, J., Belenguer, P., Guillot, P., & Thérèse, L. (2007). A simple method for measuring plasma power in rf-GDOES instruments. Analytical and Bioanalytical Chemistry, 389(3), 763-767. https://doi.org/10.1007/s00216-007-1509-3
Universell, schnell, präzise. Tiefenprofil-Analysen mit der Glimmentladungs-Spektrometrie
Aeberhard, M., Michler, J., & Nelis, T. (2006). Universell, schnell, präzise. Tiefenprofil-Analysen mit der Glimmentladungs-Spektrometrie. JOT Journal für Oberflächentechnik, 46(7), 40-44.
Characterisation of a pulsed rf-glow discharge in view of its use in OES
Nelis, T., Aeberhard, M., Hohl, M., Rohr, L., & Michler, J. (2006). Characterisation of a pulsed rf-glow discharge in view of its use in OES. Journal of Analytical Atomic Spectrometry, 21(2), 112-125. https://doi.org/10.1039/b513279g