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  • (-) Empa Laboratories = 405 Transport at Nanoscale Interfaces
  • (-) Publication Year = 2006 - 2019
  • (-) Empa Authors ≠ Jerjen, Iwan
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  • (-) Keywords = Monte Carlo simulation
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Comparison of simulated and measured spectra of an industrial 450 kV X-ray tube
Miceli, A., Thierry, R., Bettuzzi, M., Flisch, A., Hofmann, J., Sennhauser, U., & Casali, F. (2007). Comparison of simulated and measured spectra of an industrial 450 kV X-ray tube. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 580(1), 123-126. https://doi.org/10.1016/j.nima.2007.05.025
MC simulation of scatter intensities in a cone-beam CT system employing a 450 kV X-ray tube
Miceli, A., Thierry, R., Flisch, A., Sennhauser, U., & Casali, F. (2007). MC simulation of scatter intensities in a cone-beam CT system employing a 450 kV X-ray tube. In Proceedings: European NDT days in Prague 2007 (pp. 111-120). Brno university of technology.
Monte Carlo simulations of a high-resolution X-ray CT system for industrial applications
Miceli, A., Thierry, R., Flisch, A., Sennhauser, U., Casali, F., & Simon, M. (2007). Monte Carlo simulations of a high-resolution X-ray CT system for industrial applications. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 583(2-3), 313-323. https://doi.org/10.1016/j.nima.2007.09.012