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  • (-) Empa Laboratories = 405 Transport at Nanoscale Interfaces
  • (-) Publication Year = 2006 - 2019
  • (-) Empa Authors ≠ Calame, Michel
  • (-) Journal = Journal of Applied Physics
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Focused ion beam induced synthesis of a porous antimony nanowire network
Schoendorfer, C., Lugstein, A., Hyun, Y. J., Bertagnolli, E., Bischoff, L., Nellen, P. M., … Pongratz, P. (2007). Focused ion beam induced synthesis of a porous antimony nanowire network. Journal of Applied Physics, 102(4), 044308 (5 pp.). https://doi.org/10.1063/1.2771044
Sub-pixel porosity revealed by x-ray scatter dark field imaging
Revol, V., Jerjen, I., Kottler, C., Schütz, P., Kaufmann, R., Lüthi, T., … Urban, C. (2011). Sub-pixel porosity revealed by x-ray scatter dark field imaging. Journal of Applied Physics, 110(4), 044912 (5 pp.). https://doi.org/10.1063/1.3624592
Fabrication of metallic double-gate field emitter arrays and their electron beam collimation characteristics
Helfenstein, P., Jefimovs, K., Kirk, E., Escher, C., Fink, H. W., & Tsujino, S. (2012). Fabrication of metallic double-gate field emitter arrays and their electron beam collimation characteristics. Journal of Applied Physics, 112(9), 093307 (9 pp.). https://doi.org/10.1063/1.4764925
Finite element simulations of graphene based three-terminal nanojunction rectifiers
Butti, P., Shorubalko, I., Sennhauser, U., & Ensslin, K. (2013). Finite element simulations of graphene based three-terminal nanojunction rectifiers. Journal of Applied Physics, 114(3), 033710 (7 pp.). https://doi.org/10.1063/1.4815956
Field effect in the quantum Hall regime of a high mobility graphene wire
Barraud, C., Choi, T., Butti, P., Shorubalko, I., Taniguchi, T., Watanabe, K., … Ensslin, K. (2014). Field effect in the quantum Hall regime of a high mobility graphene wire. Journal of Applied Physics, 116(7), 073705 (5 pp.). https://doi.org/10.1063/1.4893468
Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: effect of the aperture edge on the ion current images
Dorwling-Carter, L., Aramesh, M., Forró, C., Tiefenauer, R. F., Shorubalko, I., Vörös, J., & Zambelli, T. (2018). Simultaneous scanning ion conductance and atomic force microscopy with a nanopore: effect of the aperture edge on the ion current images. Journal of Applied Physics, 124(17), 174902 (9 pp.). https://doi.org/10.1063/1.5053879