| Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage?
Sezen, M., Plank, H., Nellen, P. M., Meier, S., Chernev, B., Grogger, W., … Poelt, P. (2009). Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage? Physical Chemistry Chemical Physics, 11(25), 5130-5133. https://doi.org/10.1039/b816893h |
| Fabrication and modification of photonic structures with focused ion beam
Callegari, V., Nellen, P. M., Brönnimann, R., Nanzer, T., & Sennhauser, U. (2007). Fabrication and modification of photonic structures with focused ion beam. Praktische Metallographie, 44(5), 239-243. https://doi.org/10.3139/147.100341 |
| Focused ion beam iodine-enhanced etching of high aspect ratio holes in InP photonic crystals
Callegari, V., Nellen, P. M., Kaufmann, J., Strasser, P., Robin, F., & Sennhauser, U. (2007). Focused ion beam iodine-enhanced etching of high aspect ratio holes in InP photonic crystals. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 25(6), 2175-2179. https://doi.org/10.1116/1.2804607 |
| Spontaneous growth of uniformly distributed in nanodots and InI<SUB>3</SUB> nanowires on InP induced by a focused ion beam
Callegari, V., & Nellen, P. M. (2007). Spontaneous growth of uniformly distributed in nanodots and InI3 nanowires on InP induced by a focused ion beam. Physica Status Solidi A: Applications and Materials, 204(6), 1665-1671. https://doi.org/10.1002/pssa.200675337 |
| Surface chemistry and optimization of focused ion beam iodine-enhanced etching of indium phosphide
Callegari, V., Nellen, P. M., Yang, T., Hauert, R., Müller, U., Hernández-Ramírez, F., & Sennhauser, U. (2007). Surface chemistry and optimization of focused ion beam iodine-enhanced etching of indium phosphide. Applied Surface Science, 253(22), 8969-8973. https://doi.org/10.1016/j.apsusc.2007.05.026 |
| Focused ion beam modifications of indium phosphide photonic crystals
Nellen, P. M., Strasser, P., Callegari, V., Wüest, R., Erni, D., & Robin, F. (2007). Focused ion beam modifications of indium phosphide photonic crystals. Microelectronic Engineering, 84(5-8), 1244-1247. https://doi.org/10.1016/j.mee.2007.01.037 |
| Fabrication and electrical characterization of circuits based on individual tin oxide nanowires
Hernández-Ramírez, F., Tarancón, A., Casals, O., Rodríguez, J., Romano-Rodríguez, A., Morante, J. R., … Nellen, P. M. (2006). Fabrication and electrical characterization of circuits based on individual tin oxide nanowires. Nanotechnology, 17(22), 5577-5583. https://doi.org/10.1088/0957-4484/17/22/009 |
| FIB-milling of photonic structures and sputtering simulation
Nellen, P. M., Callegari, V., & Brönnimann, R. (2006). FIB-milling of photonic structures and sputtering simulation. Microelectronic Engineering, 83(4-9), 1805-1808. https://doi.org/10.1016/j.mee.2006.01.176 |
| Milling micro-structures using focused ion beams and its application to photonic components
Nellen, P. M., & Brönnimann, R. (2006). Milling micro-structures using focused ion beams and its application to photonic components. Measurement Science and Technology, 17(5), 943-948. https://doi.org/10.1088/0957-0233/17/5/S01 |
| Preparative methods for nanoanalysis of materials with focused ion beam instruments
Nellen, P. M., Callegari, V., & Sennhauser, U. (2006). Preparative methods for nanoanalysis of materials with focused ion beam instruments. Chimia, 60(11), 735-741. https://doi.org/10.2533/chimia.2006.735 |